ETASR awarded an IF from ResearchGate
Engineering, Technology & Applied Science Research has been awarded an Impact Factor of 0.43 from ResearchGate.
Engineering, Technology & Applied Science Research has been awarded an Impact Factor of 0.43 from ResearchGate.
Journal Issues
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Journal Abbreviation
Eng. Technol. Appl. Sci. Res.
eISSN
1792-8036
pISSN
2241-4487
Web of Science JCI
0.49
Web of Science Impact Factor
1.5
Clarivate JCI Quartile Ranking
Q2
Scopus CiteScore Tracker (November 2023)
2.7
Crossref Membership
DOI prefix: 10.48084
Direct DOI link:
https://doi.org/10.48084/etasr
Citation Styling
Available in the official Zotero Style Repository (add it from inside Zotero or download the csl file)
RIS/BIB Files
Download links available in each article's abstract page.
Additional Information
For Readers
For Authors
For Librarians
Announcements
See all our announcements here.
[ETASR cover artwork created by our late friend, the great N. Tsagkarakis. Download HR here]
Some updated stats about ETASR (October 14, 2023):
- Editorial Board: 46 board members / 46 institutions / 31 different countries
- 13th year of operation, 77 issues (bimonthly, first issue in Feb. 2011)
- 1989 published papers, 6183 authors (3.11 authors per paper) from 79 different countries and 1061 different institutions/organizations (not counting departments)
- 13051 registered readers from 112 different countries
- mean number of Crossref citations per paper: 4.52
- days to acceptance: 46
- Clarivate (Web of Science) Impact Factor: 1.5
- Clarivate (Web of Science) JCI: 0.49
- Clarivate JCI Quartile Ranking: Q2
Indexed in: Web of Science / Master Journal List / Emerging Sources Citation Index, Scopus, National Library of Greece, Directory of Open Access Journals (DOAJ) (incl. DOAJ Seal), Crossref, HEAL-Link, ReviewerCredits, Publons, ResearchGate, Scilit, EBSCOhost, Exaly, HEC Journal Recognition System (HJRC), Zenodo, Google Scholar, SHERPA/ROMEO, MedOAnet, Directory of Open Access Scholarly Resources (ROAD), Publication Integrity & Ethics (PIE) and many more.