Dinh HL, Doan DV, Nguyen NK, Nguyen DT, Hoang HH. Autonomous Defect Classification in Manufacturing: A Novel Few-Shot Vision-Language Modeling Approach. Eng. Technol. Appl. Sci. Res. [Internet]. 2026 Jun. 6 [cited 2026 Jun. 29];16(3):36545-51. Available from: https://www.etasr.com/index.php/ETASR/article/view/18859